ASM Orange Coast Chapter
Chris Rood
Japan Electron Optics Laboratory USA
“Latest in Microscopy Technology”
October 22, 2008
JEOL a leading supplier of scanning electron microscopes transmission electron microscopes and other tools for sientific and industrial purposes.
Included will be a brief talk on the latest in sample polishing techniques using an ion polisher.
Support Documentation:
New Methods for Cross-Section Sample Preparation Using Broad Argon Ion Beam
Cross Section Polisher
Meeting:
- 6:15pm-7:00pm-networking
- 7:00pm-Dinner
- Followed by feature presentation
Location:
Dave and Buster's Irvine Spectrum (off 405 freeway)
71 Fortune Drive, Suite 960
Irvine , CA 92618
ph: 949-727-0555